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College of Arts & Sciences
The Electron Microscopy Center


Zeiss Ultraplus Thermal Field Emission Scanning Electron Microscope

The Zeiss Ultraplus Thermal Field Emission Scanning Electron Microscope is a high vacuum, high resolution scanning electron microscope with the capability for EDS and is equipped with a Nabity e-beam lithography system. The equipment is outfitted with a charge compensator for non-conductive specimen imaging and a STEM detector.  The instrument also has the following detectors: In-lens detector, EsB detector, AsB detector, an Everhart-Thornley detector, and a CCD camera with infrared illumination.

For complete specifications, click here for PDF.